# Gauging Probe Systems - Published: 2025-07-01 - Updated: 2026-09-09 - Author: aktd-om - Source: https://precisioneersgroup.com/gauging-probe-systems/ --- # Gauging Probe Systems ![Industrial gauge block calibration system with vertical probe and horizontal base on white background](https://precisioneersgroup.com/wp-content/uploads/2026/06/Gauge-Block-Calibration-System-EPP2-600x450-1.png) Gauging probe measurement systems use a tactile probe combined with a laser interferometer to measure length and thickness. They offer a high linearity and a constant probe measuring force over the entire measuring range. The measurement range is 20 mm, or 50 mm, with a resolution of between 0.1 and 1 nm. A custom solution based on only laser interferometric measurements (without tactile contact), are also available on request. Gauging probe systems are used for quality control, calibration, thickness measurement, and gauge block calibration and inspection. ## Gauging Probe Featured Systems: ![Gauging Probe System available thru the Precisioneers](https://precisioneersgroup.com/wp-content/uploads/2025/07/SIOS-Gauging-Probe-Systems-csm_messtaster-lm-20-50_1b4d5b18d2-1024x768.png) **High Linearity Gauging Probe System, LM 20/50** - Laser interferometric precision probe for tactile length/thickness measurements - Linearity ≤ ±2 nm - Measuring force fixed adjustable of 0.5 ... 1.5 N - High linearity over the entire measuring range - Constant probe measuring force over the entire measuring range - Open interfaces for OEM software using Windows or Linux The LM models use laser interferometric probes as precision linear encoders. Tactile measurements are possible over a measuring range of 20 or 50 mm with nanometer accuracies. The integrated laser interferometer converts the measuring movement of the motor-driven measuring spindles into an interference signal. This optical measurement signal is transmitted by fiber optics to the optoelectronic supply and evaluation unit and output as a length value. | Sub-set of Datasheet Features | Model LM 20/50 | | --- | --- | | [Measuring Range](https://royal-elementor-addons.com/) | [20 mm for the LM 20, 50 mm for the LM 50](https://royal-elementor-addons.com/) | | [Resolution](https://royal-elementor-addons.com/) | [0.1 nm](https://royal-elementor-addons.com/) | | [Linearity over the Entire Measurement Range](https://royal-elementor-addons.com/) | [≤ ±2 nm](https://royal-elementor-addons.com/) | | [Measuring Force (Fixed at Factory)](https://royal-elementor-addons.com/) | [0.5 N ... 1.5 N](https://royal-elementor-addons.com/) | | [Power Supply](https://royal-elementor-addons.com/) | [100...240 VAC / 47...63 Hz](https://royal-elementor-addons.com/) | [Download Datasheet for High Linearity Probe System](https://precisioneersgroup.com/wp-content/uploads/2026/06/Datasheet-Gauging-Probe-LM.pdf) **For more details in North America,**contact Yuri Toegemann, [yuri.toegemann@sios.de](mailto:yuri.toegemann@sios.de) ![Industrial gauge block calibration system with vertical probe arm and control panel](https://precisioneersgroup.com/wp-content/uploads/2026/06/Gauge-Block-Calibration-System-EPP2-600x450-2.png) **Gauge Block Comparator, EPP-2** - Reproducibility of the measurements is <5 nm - Abbe-error-free probing with 2 interferometric probes - Only 15 standard gauge blocks required for the calibration of a 122-piece gauge block set - Cost and time savings due to less calibration effort required - Shorter measurement time due to user-guided measurement sequence (~5 seconds/sample) - Calibration of unusual nominal dimensions and materials are possible - High linearity over the entire measuring range - Constant probe measuring force over the entire measuring range - Correction of the test specimen and standard temperature is possible - Optional 4-piece materials temperature sensor - PC software using Windows The EPP-2 gauge block test station is designed for calibrating parallel gauge blocks using a laser interferometric probe for both measuring probes. This system is easy to operate, and the correction, evaluation and output of the measured values are carried out via a GUI or PC. The open SIOS hardware library allows easy integration of the device into your existing software. | Sub-set of Datasheet Features | Model EPP-2 | | --- | --- | | [Probe Design](https://royal-elementor-addons.com/) | [Dual probe system LM-2-20](https://royal-elementor-addons.com/) | | [Probing Forces (Constant over the entire measuring range)](https://royal-elementor-addons.com/) | [Upper probe < 1 N, Lower probe < 0.5 N](https://royal-elementor-addons.com/) | | [Repeatability](https://royal-elementor-addons.com/) | [< 5 nm](https://royal-elementor-addons.com/) | | [Resolution](https://royal-elementor-addons.com/) | [0.1 nm](https://royal-elementor-addons.com/) | | [Gauge Block Measuring Range](https://royal-elementor-addons.com/) | [0.5 mm ... 100 mm](https://royal-elementor-addons.com/) | [Download Datasheet for the EPP-2 Gauge Block Comparator](https://precisioneersgroup.com/wp-content/uploads/2026/06/Datasheet-Gauge-Block-Calibration-system-EPP.pdf) **For more details in North America,**contact Yuri Toegemann, [yuri.toegemann@sios.de](mailto:yuri.toegemann@sios.de) ### Discover more Products about Customized Measurement and Microscopes [Nanomeasuring Machine](/nanomeasuring-machine/) [Part Measuring Microscopes](/part-measuring-microscopes/) [VMM Measuring Microscopes](/vmm-measuring-microscopes/) [Microscope Lighting](/microscope-lighting/) [Alignment Testing Microscope](/alignment-testing-microscope/) ### in cooperation with: [![sios logo](https://precisioneersgroup.com/wp-content/uploads/2025/05/sioslogojpg-300x142.jpeg)](/sios/) **SIOS Meßtechnik GmbH** ## Do you need more information? Would you like to speak with an application engineer? Contact us here. #### Address 1 Cabot Road, Suite 210 Hudson, MA 01749 #### Call Us 1-508-634-6688 #### Email Us [Contact@PrecisioneersGroup.com](mailto:Contact@PrecisioneersGroup.com)